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December 15, 2020 - December 15, 2021

colorful wafer the last frontier

This 2.5 hour webinar is offered OnDemand from the SEMI Library.



    United States

    colorful wafer the last frontier

    About The Webinar

    Defect prediction and defect source mitigation is critical to enabling high-volume manufacturing at all semiconductor fabs, but especially at advanced process nodes. This program will provide perspectives on:

    • Importance of OEM part design, cleaning & refurbishment loops for advanced node high volume manufacturing and designing for zero defects
    • The standards gap between cleanliness specs, measurement methods & successful predictive maintenance (PdM) in the Fab  and how to enable AI based maintenance scheduling
    • Applicability of cleaning techniques vs OEM part designs and mitigating human variability during parts cleaning
    • The emerging considerations for parts designed to facilitate cleaning

    Who Should Attend

    • IDMs, fabs, foundries; fab managers, process engineers
    • Semiconductor processing equipment OEMs
    • Critical chamber component suppliers
    • Semiconductor processing equipment parts clean vendors
    • Parts clean metrology service providers


    8:00 am - 8:05 am
    Paul Trio
    Paul Trio

    Welcome Remarks & Moderation

    Paul Trio, Senior Manager, Strategic Initiatives

    8:05 am - 8:40 am
    Patrick Martin, Applied Materials
    Patrick Martin

    OEM Perspective on Parts Cleaning - Cleanliness and Hardware Connectivity

    Patrick Martin, Business Development, New Markets and Alliances
    Applied Materials

    Speaker Bios

    8:40 am - 9:15 am
    dave Laube
    David Laube

    Parts Cleaning from Design to Scrap

    David Laube, CTO,
    Pentagon Technologies

    Speaker Bios

    Reed Rosenberg
    Reed Rosenberg

    Parts Cleaning from Design to Scrap

    Reed Rosenberg, CTO
    Cleanpart USA

    Speaker Bios

    9:15 am - 10:00 am
    Victor Chia
    Victor Chia

    Cleanliness Metrology

    Victor Chia, International Expert; Director, Surface Contamination Technologies
    Air Liquide / Balazs NanoAnalysis

    Speaker Bios

    10:00 am - 10:15 am
    Max van den Berg
    Max van den Berg

    Product Cleanliness – International Collaboration Initiatives

    Max van den Berg, System Architect, Electronics and Assembly, Global Application Engineering

    Speaker Bios

    10:15 am - 10:30 am

    Q&A and Closing Remarks

    Questions about the webinar? Contact


    Semiconductor Components, Instruments, and Subsystems (SCIS) is a SEMI technology community chartered to address process-critical components challenges to meet the demands of high-volume manufacturing (HVM) at advanced process nodes. SCIS brings together all stakeholders that are driving yield improvements through the very last frontier of component and hardware defect reduction.