Neural Networks and Transfer Learning Empowering Semiconductor Manufacturing
As semiconductor manufacturing processes grow more complex and sophisticated, production defects become both more common and harder to predict. Traditional process control techniques such as statistical process control (SPC) are now too limited...
Multi-Sensor Metrology Tools for Hybrid Metrology
SEMI spoke with Thomas Fries, founder and CEO of FRT GmbH, about how hybrid metrology is shaping multi-sensor metrology tools to enhance measurement precision as the industry moves away from a single-sensor approach.